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Spatial and spectral behavior of speckle in an imaging system


Melville, Richard Devern Samuels (1975) Spatial and spectral behavior of speckle in an imaging system. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/2KP8-CT79.


When coherent illumination is reflected from or transmitted through a medium which causes random phase changes in the illumination, a random interference pattern termed speckle results.

We have studied speckle in an imaging system and have described and measured the effect of polarization of the illumination, the first order statistics of speckle intensity, and the autocorrelation of speckle intensity as a function of space and wavelength variables.

We have measured the relationship between the amount of depolarization of a plane polarized input in transmission through opal glass diffusers of various thicknesses and the effect of this phenomenon on the first and second order statistics of speckle intensity. A relationship between diffuser thickness and the probability density function for speckle intensities has been calculated and measured. The autocorrelation of speckle intensities has been calculated and measured as a function of both the spatial dimension of the speckle pattern and the wavelength of the illumination. We find that the spatial behavior of the autocorrelation depends upon the limiting aperture of the optical system, while the wavelength dependence is a function of the roughness of the diffuser and is only very slightly influenced by the imaging system.

Item Type:Thesis (Dissertation (Ph.D.))
Degree Grantor:California Institute of Technology
Division:Engineering and Applied Science
Major Option:Electrical Engineering
Thesis Availability:Public (worldwide access)
Research Advisor(s):
  • George, Nicholas A.
Thesis Committee:
  • Unknown, Unknown
Defense Date:18 February 1975
Record Number:CaltechETD:etd-02182005-111421
Persistent URL:
Default Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:672
Deposited By: Imported from ETD-db
Deposited On:18 Feb 2005
Last Modified:21 Dec 2019 01:47

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