The Evaluation of E-k Curves from Tunneling Currents

Citation

McGill, Thomas Conley, Jr. (1969) The Evaluation of E-k Curves from Tunneling Currents. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/D3BX-RQ47. https://resolver.caltech.edu/CaltechETD:etd-12122006-092025

Abstract

The basis for interpreting I-V data taken on metal-insulator-metal structures with insulator thicknesses of less than 100 Å is examined carefully. A set of experimental tests for determining the applicability of the equation linking the I-V data to the E-k curve is presented. These tests are found to be a stringent requirement on the experimental data and to support strongly the interpretation of the experimental I-V in terms of the E-k curve for the insulator. A numerical technique for obtaining the E-k curve from I-V data is presented, and applied to data taken on Al-AlN-(Mg,Au) structures where it allows the evaluation of the E-k curve for AlN throughout the forbidden gap.

Item Type:	Thesis (Dissertation (Ph.D.))
Subject Keywords:	(Electrical Engineering, Physics and Chemistry)
Degree Grantor:	California Institute of Technology
Division:	Engineering and Applied Science
Major Option:	Electrical Engineering
Minor Option:	Chemistry Physics
Thesis Availability:	Public (worldwide access)
Research Advisor(s):	Mead, Carver
Thesis Committee:	Unknown, Unknown
Defense Date:	15 May 1969
Record Number:	CaltechETD:etd-12122006-092025
Persistent URL:	https://resolver.caltech.edu/CaltechETD:etd-12122006-092025
DOI:	10.7907/D3BX-RQ47
Default Usage Policy:	No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:	4966
Collection:	CaltechTHESIS
Deposited By:	Imported from ETD-db
Deposited On:	05 Jan 2007
Last Modified:	03 May 2024 20:50

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