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The evaluation of E-k curves from tunneling currents


McGill, T. C. (1969) The evaluation of E-k curves from tunneling currents. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/D3BX-RQ47.


The basis for interpreting I-V data taken on metal-insulator-metal structures with insulator thicknesses of less than 100 Å is examined carefully. A set of experimental tests for determining the applicability of the equation linking the I-V data to the E-k curve is presented. These tests are found to be a stringent requirement on the experimental data and to support strongly the interpretation of the experimental I-V in terms of the E-k curve for the insulator. A numerical technique for obtaining the E-k curve from I-V data is presented, and applied to data taken on Al-AlN-(Mg,Au) structures where it allows the evaluation of the E-k curve for AlN throughout the forbidden gap.

Item Type:Thesis (Dissertation (Ph.D.))
Degree Grantor:California Institute of Technology
Division:Engineering and Applied Science
Major Option:Electrical Engineering
Thesis Availability:Public (worldwide access)
Research Advisor(s):
  • Mead, Carver
Thesis Committee:
  • Mead, Carver (chair)
  • Lewicki, George W.
  • Franklin, Joel N.
Defense Date:15 May 1969
Record Number:CaltechETD:etd-12122006-092025
Persistent URL:
Default Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:4966
Deposited By: Imported from ETD-db
Deposited On:05 Jan 2007
Last Modified:21 Dec 2019 04:45

Thesis Files

PDF (McGill_tc_1969.pdf) - Final Version
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