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Investigations of Schottky Barrier Structures in Compound Semiconductors: I. HgTe on CdTe: A Lattice Matched Schottky Barrier. II. Au-Cd Barriers to CdTe. III. Au Barriers on InₓGa₁₋ₓP

Citation

Kuech, Thomas Francis (1981) Investigations of Schottky Barrier Structures in Compound Semiconductors: I. HgTe on CdTe: A Lattice Matched Schottky Barrier. II. Au-Cd Barriers to CdTe. III. Au Barriers on InₓGa₁₋ₓP. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/8hcw-7421. https://resolver.caltech.edu/CaltechETD:etd-12122006-090129

Abstract

i) The Au Schottky barrier height to n - InxGa1-xP was measured as a function of alloy composition. The Au barrier, φp, to p - InxGa1-xP was found to be independent of composition. The barrier, φp, was determined by the relation φp + φn = φg where φg is the band gap energy and φn is the measured barrier height to n - InxGa1-xP. It has been observed that the Au barrier height to p-type material for most compound semiconductors is determined by the anion. This dependence on the anion of the compound has now been seen to extend to the alloy system InxGa1-xP measured here.

ii) The Schottky barrier height of Cd, Au, and Au-Cd alloys was determined on vacuum cleaved surfaces of n-CdTe. A large barrier of 0.92 eV was found in the case of the Au-Cd alloy contacts. Contacts made with elemental Cd or Au gave barrier heights of 0.45 and 0.65 eV, respectively. The increased barrier height found on Au-Cd alloy contacts may be related to recent UHV observations on Schottky barrier formation where crystal defects play a role in determining the observed barrier height.

iii) HgTe-CdTe lattice matched heterojunctions were formed by the epitaxial growth of HgTe on CdTe substrates using a new low temperature metal organic chemical vapor deposition (MOCVD) technique. These heterojunctions combine features of the Schottky barrier structure, due to the high carrier concentrations found in the semi-metallic HgTe, with the structural perfection present in a lattice matched heterojunction. The measured Schottky barrier height varied from 0.65 to 0.90 eV depending on the details of the HgTe growth procedure used. Two models of the HgTe-CdTe heterojunction are presented which account for the observed variation in barrier height.

Item Type:Thesis (Dissertation (Ph.D.))
Subject Keywords:Applied Physics
Degree Grantor:California Institute of Technology
Division:Engineering and Applied Science
Major Option:Applied Physics
Thesis Availability:Public (worldwide access)
Research Advisor(s):
  • McCaldin, James Oeland
Thesis Committee:
  • McCaldin, James Oeland (chair)
  • Goddard, William A., III
  • McGill, Thomas C.
  • Rutledge, David B.
  • Nicolet, Marc-Aurele
Defense Date:7 April 1981
Additional Information:In 1980 Commencement Program, thesis entitled: "Investigations of Schottky Barrier Structures in Compound Semiconductors. I. HgTe on CdTe: A Lattice Matched Scottky Barrier. II. Au-Cd Barriers to CdTe. III. Au Barriers on In(x)Ga(1-x)P."
Funders:
Funding AgencyGrant Number
CaltechUNSPECIFIED
Office of Naval Research (ONR)UNSPECIFIED
ARCS FoundationUNSPECIFIED
Record Number:CaltechETD:etd-12122006-090129
Persistent URL:https://resolver.caltech.edu/CaltechETD:etd-12122006-090129
DOI:10.7907/8hcw-7421
Related URLs:
URLURL TypeDescription
https://doi.org/10.1116/1.570611DOIArticle adapted for Chapter 3.
https://doi.org/10.1149/1.2127566DOIArticle adapted for Chapter 5.
Default Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:4964
Collection:CaltechTHESIS
Deposited By: Imported from ETD-db
Deposited On:22 Dec 2006
Last Modified:24 May 2024 18:33

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