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Techniques for Testing Integrated Circuits


DeBenedictis, Erik Penn (1982) Techniques for Testing Integrated Circuits. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/ZKWD-NR73.


A language is presented for describing tests of integrated circuits. The language has a high abstractive capability that enables test specifications to follow the structural or logical organization of a design. The test language is applied to a number of current design styles in a series of examples. Methods for designing integrated circuits for testability are demonstrated. An implementation of the test language through a test language interpreter and a tester is discussed. Tester designs are presented that will execute the test language with unusually high efficiency.

Item Type:Thesis (Dissertation (Ph.D.))
Subject Keywords:Computer Science
Degree Grantor:California Institute of Technology
Division:Engineering and Applied Science
Major Option:Computer Science
Thesis Availability:Public (worldwide access)
Research Advisor(s):
  • Seitz, Charles L.
Thesis Committee:
  • Seitz, Charles L. (chair)
  • Bryant, Randy
  • Fox, Geoffrey C.
  • Johnsson, S. Lennart
  • Mead, Carver
Defense Date:5 May 1982
Funding AgencyGrant Number
Defense Advanced Research Projects Agency (DARPA)3771
Office of Naval Research (ONR)N-00014-79-C-0597
Record Number:CaltechETD:etd-09062006-111645
Persistent URL:
Default Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:3358
Deposited By: Imported from ETD-db
Deposited On:22 Sep 2006
Last Modified:22 Sep 2020 00:32

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