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A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts

Citation

Felt, Gaelen Lee (1951) A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/H0QJ-YJ54. https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172

Abstract

The apparatus used in the experiment is described in detail and the calibration of the instruments is discussed. The procedure followed in the experiment is described. Experimental results are presented in the form of curves and the analysis of the curves is given in detail. The final value of the ratio h/e obtained in this experiment is

h/e = 1.37912 ± 0.00007 x 10-17erg-sec/esu

Item Type:Thesis (Dissertation (Ph.D.))
Subject Keywords:Physics
Degree Grantor:California Institute of Technology
Division:Physics, Mathematics and Astronomy
Major Option:Physics
Thesis Availability:Public (worldwide access)
Research Advisor(s):
  • DuMond, Jesse William Monroe
Thesis Committee:
  • Unknown, Unknown
Defense Date:1 January 1951
Funders:
Funding AgencyGrant Number
Office of Naval ResearchN6 onr-244
Record Number:CaltechTHESIS:10172017-084702172
Persistent URL:https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172
DOI:10.7907/H0QJ-YJ54
Default Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:10523
Collection:CaltechTHESIS
Deposited By: Benjamin Perez
Deposited On:17 Oct 2017 16:08
Last Modified:21 Dec 2019 01:24

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