Citation
Felt, Gaelen Lee (1951) A Measurement of the Value of h/e by the Determination of the Short Wavelength Limit of the Continuous X-Ray Spectrum at 25 Kilovolts. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/H0QJ-YJ54. https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172
Abstract
The apparatus used in the experiment is described in detail and the calibration of the instruments is discussed. The procedure followed in the experiment is described. Experimental results are presented in the form of curves and the analysis of the curves is given in detail. The final value of the ratio h/e obtained in this experiment is
h/e = 1.37912 ± 0.00007 x 10-17erg-sec/esu
| Item Type: | Thesis (Dissertation (Ph.D.)) | ||||
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| Subject Keywords: | (Physics and Electrical Engineering) | ||||
| Degree Grantor: | California Institute of Technology | ||||
| Division: | Physics, Mathematics and Astronomy | ||||
| Major Option: | Physics | ||||
| Minor Option: | Electrical Engineering | ||||
| Thesis Availability: | Public (worldwide access) | ||||
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| Thesis Committee: |
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| Defense Date: | 1 January 1951 | ||||
| Funders: |
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| Record Number: | CaltechTHESIS:10172017-084702172 | ||||
| Persistent URL: | https://resolver.caltech.edu/CaltechTHESIS:10172017-084702172 | ||||
| DOI: | 10.7907/H0QJ-YJ54 | ||||
| Default Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||
| ID Code: | 10523 | ||||
| Collection: | CaltechTHESIS | ||||
| Deposited By: | Benjamin Perez | ||||
| Deposited On: | 17 Oct 2017 16:08 | ||||
| Last Modified: | 02 May 2023 16:25 |
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