McGill, T. C. (1969) The evaluation of E-k curves from tunneling currents. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-12122006-092025
The basis for interpreting I-V data taken on metal-insulator-metal structures with insulator thicknesses of less than 100 Å is examined carefully. A set of experimental tests for determining the applicability of the equation linking the I-V data to the E-k curve is presented. These tests are found to be a stringent requirement on the experimental data and to support strongly the interpretation of the experimental I-V in terms of the E-k curve for the insulator. A numerical technique for obtaining the E-k curve from I-V data is presented, and applied to data taken on Al-AlN-(Mg,Au) structures where it allows the evaluation of the E-k curve for AlN throughout the forbidden gap.
|Item Type:||Thesis (Dissertation (Ph.D.))|
|Degree Grantor:||California Institute of Technology|
|Division:||Engineering and Applied Science|
|Major Option:||Electrical Engineering|
|Thesis Availability:||Public (worldwide access)|
|Defense Date:||15 May 1969|
|Default Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Imported from ETD-db|
|Deposited On:||05 Jan 2007|
|Last Modified:||26 Dec 2012 03:13|
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