Citation
McGill, T. C. (1969) The evaluation of E-k curves from tunneling currents. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-12122006-092025
Abstract
The basis for interpreting I-V data taken on metal-insulator-metal structures with insulator thicknesses of less than 100 Å is examined carefully. A set of experimental tests for determining the applicability of the equation linking the I-V data to the E-k curve is presented. These tests are found to be a stringent requirement on the experimental data and to support strongly the interpretation of the experimental I-V in terms of the E-k curve for the insulator. A numerical technique for obtaining the E-k curve from I-V data is presented, and applied to data taken on Al-AlN-(Mg,Au) structures where it allows the evaluation of the E-k curve for AlN throughout the forbidden gap.
| Item Type: | Thesis (Dissertation (Ph.D.)) |
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| Degree Grantor: | California Institute of Technology |
| Division: | Engineering and Applied Science |
| Major Option: | Electrical Engineering |
| Thesis Availability: | Public (worldwide access) |
| Research Advisor(s): |
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| Thesis Committee: |
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| Defense Date: | 15 May 1969 |
| Record Number: | CaltechETD:etd-12122006-092025 |
| Persistent URL: | http://resolver.caltech.edu/CaltechETD:etd-12122006-092025 |
| Default Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 4966 |
| Collection: | CaltechTHESIS |
| Deposited By: | Imported from ETD-db |
| Deposited On: | 05 Jan 2007 |
| Last Modified: | 26 Dec 2012 03:13 |
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