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Brown, Michal Amaris (2007) Measuring Stress in Thin-Film - Substrate Systems Featuring Spatial Nonuniformities of Film Thickness and/or Misfit Strain. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/9GD9-A088. https://resolver.caltech.edu/CaltechETD:etd-06042007-171342

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