Electrical Conduction and Crystallization Phenomena in Thin Lead Films at Temperatures Between 14°K and 500°K

Citation

Armi, Edgar Leo (1941) Electrical Conduction and Crystallization Phenomena in Thin Lead Films at Temperatures Between 14°K and 500°K. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/xkys-vw62. https://resolver.caltech.edu/CaltechTHESIS:02112025-192233725

Abstract

This thesis presents a description of the design of and the results obtained with an apparatus constructed for producing thin metal films, by the method of evaporation in high vacuum, and to study the electrical behavior of such films at various temperatures.

Experimental investigations were carried out in a temperature range from 14°K to 500°K. Electric resistances were measured with adequate accuracy between 10² and 10¹⁵ ohms. Evaporation rates against furnace temperatures were determined by weighing of deposits and were found to be in good agreement with specific predictions of Kinetic Theory.

Formation and destruction of electric conductivity were analyzed in their dependence upon temperature, time and vacuum conditions. Part of the experiments were carried out at temperatures low enough to prevent crystallization, thus permitting to study the undisturbed process of the building up of metallic conduction. Formulas are suggested to describe the behavior of the films investigated.

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