Diffraction of Long Wavelength X-Ray

Citation

Henke, Burton L. (1953) Diffraction of Long Wavelength X-Ray. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/2JGQ-WN90. https://resolver.caltech.edu/CaltechETD:etd-04232003-102801

Abstract

The theory and application of diffraction by long, x-ray wavelengths are discussed. Four methods obtaining the diffraction pattern are described, namely (1) the double-crystal spectrometer, (2) the annular slit system, (3) the concave mica, point-focusing monochromator, and (4) the total-reflection, point-focusing system. The design and construction of the total-reflection equipment is described in detail. This method is applied to the measurement of the Dow latex particles.

Item Type:	Thesis (Dissertation (Ph.D.))
Subject Keywords:	(Physics and Electrical Engineering)
Degree Grantor:	California Institute of Technology
Division:	Physics, Mathematics and Astronomy
Major Option:	Physics
Minor Option:	Electrical Engineering
Thesis Availability:	Public (worldwide access)
Research Advisor(s):	DuMond, Jesse William Monroe
Thesis Committee:	Unknown, Unknown
Defense Date:	1 January 1953
Additional Information:	Title varies in the 1953 Caltech Commencement program; Soft X-Ray, Low-Angle Diffraction Using a High Intensity, Point-Focusing Unit
Record Number:	CaltechETD:etd-04232003-102801
Persistent URL:	https://resolver.caltech.edu/CaltechETD:etd-04232003-102801
DOI:	10.7907/2JGQ-WN90
Default Usage Policy:	No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:	1465
Collection:	CaltechTHESIS
Deposited By:	Imported from ETD-db
Deposited On:	23 Apr 2003
Last Modified:	19 May 2023 20:44

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