Panofsky, Wolfgang K. H. (1941) A measurement of the value of h/e by the determination of the short wavelength limit of the continuous x-ray spectrum at 20kV. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-06182004-143223
NOTE: Text or symbols not renderable in plain ASCII are indicated by [...]. Abstract is included in .pdf document.
In order to investigate the causes of the discrepancy among the measurable functions of the atomic constants e, h, and m, a redetermination of the ratio h/e was undertaken by the method of the determination of the short wavelength limit of the continuous x-ray spectrum. The reliability of the measurements is increased due to
1) The use of large primary intensity
2) Automatic voltage stabilization
3) Improved methods of voltage measurement
4) Improved monochromatization by the combined use of balanced filters and a 2-crystal spectrometer of high resolving power
5) Cleaning of the target in vacuo.
The results of the work indicate a value of [...].
The sources of error are discussed.
|Item Type:||Thesis (Dissertation (Ph.D.))|
|Degree Grantor:||California Institute of Technology|
|Division:||Physics, Mathematics and Astronomy|
|Thesis Availability:||Public (worldwide access)|
|Defense Date:||1 January 1941|
|Default Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Imported from ETD-db|
|Deposited On:||21 Jun 2004|
|Last Modified:||26 Dec 2012 02:53|
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