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A measurement of the value of h/e by the determination of the short wavelength limit of the continuous x-ray spectrum at 20kV

Citation

Panofsky, Wolfgang K. H. (1941) A measurement of the value of h/e by the determination of the short wavelength limit of the continuous x-ray spectrum at 20kV. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-06182004-143223

Abstract

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In order to investigate the causes of the discrepancy among the measurable functions of the atomic constants e, h, and m, a redetermination of the ratio h/e was undertaken by the method of the determination of the short wavelength limit of the continuous x-ray spectrum. The reliability of the measurements is increased due to

1) The use of large primary intensity

2) Automatic voltage stabilization

3) Improved methods of voltage measurement

4) Improved monochromatization by the combined use of balanced filters and a 2-crystal spectrometer of high resolving power

5) Cleaning of the target in vacuo.

The results of the work indicate a value of [...].

The sources of error are discussed.

Item Type:Thesis (Dissertation (Ph.D.))
Degree Grantor:California Institute of Technology
Division:Physics, Mathematics and Astronomy
Major Option:Physics
Thesis Availability:Public (worldwide access)
Research Advisor(s):
  • Unknown, Unknown
Thesis Committee:
  • Unknown, Unknown
Defense Date:1 January 1941
Record Number:CaltechETD:etd-06182004-143223
Persistent URL:http://resolver.caltech.edu/CaltechETD:etd-06182004-143223
Default Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2639
Collection:CaltechTHESIS
Deposited By: Imported from ETD-db
Deposited On:21 Jun 2004
Last Modified:26 Dec 2012 02:53

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