Fon, Warren Chung Wah (2004) Thermal properties of nano- and microstructures. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-05262004-123035
My work is on the experimental study of thermal conduction in nano and microscale structures. The work is divided into two parts. In the first part, we measure the thermal conductance of a suspended device from 4 to 40 K. The thermal conduction of a suspended, free-standing beam is analyzed to study the effect of phonon scattering on thermal conduction. We conclude that phonon scattering is much more severe in a nanoscale beam than bulk material.
In the second part of the work, we proceed to dynamic measurement to measure the heat capacity of a suspended device. From that we study the origin of heat capacity of a silicon nitride membrane. We conclude that much of the heat capacity comes from the motional tunneling states of the ions. We use the device to demonstrate an ultrasensitive calorimeter with a very high resolution of 0.5 aJ/K. We conclude the work by applying the calorimeter to study the heat capacity of a thin adsorbed film of helium gas.
|Item Type:||Thesis (Dissertation (Ph.D.))|
|Subject Keywords:||nanostructure; phonon scattering; thermal|
|Degree Grantor:||California Institute of Technology|
|Division:||Engineering and Applied Science|
|Major Option:||Engineering and Applied Science|
|Thesis Availability:||Public (worldwide access)|
|Defense Date:||24 May 2004|
|Non-Caltech Author Email:||fon (AT) caltech.edu|
|Default Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Imported from ETD-db|
|Deposited On:||26 May 2004|
|Last Modified:||26 Dec 2012 02:46|
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