Citation
Henke, Burton L. (1953) Diffraction of long wavelength x-ray. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-04232003-102801
Abstract
The theory and application of diffraction by long, x-ray wavelengths are discussed. Four methods obtaining the diffraction pattern are described, namely (1) the double-crystal spectrometer, (2) the annular slit system, (3) the concave mica, point-focusing monochromator, and (4) the total-reflection, point-focusing system. The design and construction of the total-reflection equipment is described in detail. This method is applied to the measurement of the Dow latex particles.
| Item Type: | Thesis (Dissertation (Ph.D.)) |
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| Degree Grantor: | California Institute of Technology |
| Division: | Physics, Mathematics and Astronomy |
| Major Option: | Physics |
| Thesis Availability: | Public (worldwide access) |
| Research Advisor(s): |
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| Thesis Committee: |
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| Defense Date: | 1 January 1953 |
| Record Number: | CaltechETD:etd-04232003-102801 |
| Persistent URL: | http://resolver.caltech.edu/CaltechETD:etd-04232003-102801 |
| Default Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 1465 |
| Collection: | CaltechTHESIS |
| Deposited By: | Imported from ETD-db |
| Deposited On: | 23 Apr 2003 |
| Last Modified: | 26 Dec 2012 02:38 |
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