Henke, Burton L. (1953) Diffraction of long wavelength x-ray. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-04232003-102801
The theory and application of diffraction by long, x-ray wavelengths are discussed. Four methods obtaining the diffraction pattern are described, namely (1) the double-crystal spectrometer, (2) the annular slit system, (3) the concave mica, point-focusing monochromator, and (4) the total-reflection, point-focusing system. The design and construction of the total-reflection equipment is described in detail. This method is applied to the measurement of the Dow latex particles.
|Item Type:||Thesis (Dissertation (Ph.D.))|
|Degree Grantor:||California Institute of Technology|
|Division:||Physics, Mathematics and Astronomy|
|Thesis Availability:||Public (worldwide access)|
|Defense Date:||1 January 1953|
|Default Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Imported from ETD-db|
|Deposited On:||23 Apr 2003|
|Last Modified:||26 Dec 2012 02:38|
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