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Diffraction of long wavelength x-ray

Citation

Henke, Burton L. (1953) Diffraction of long wavelength x-ray. Dissertation (Ph.D.), California Institute of Technology. http://resolver.caltech.edu/CaltechETD:etd-04232003-102801

Abstract

The theory and application of diffraction by long, x-ray wavelengths are discussed. Four methods obtaining the diffraction pattern are described, namely (1) the double-crystal spectrometer, (2) the annular slit system, (3) the concave mica, point-focusing monochromator, and (4) the total-reflection, point-focusing system. The design and construction of the total-reflection equipment is described in detail. This method is applied to the measurement of the Dow latex particles.

Item Type:Thesis (Dissertation (Ph.D.))
Degree Grantor:California Institute of Technology
Division:Physics, Mathematics and Astronomy
Major Option:Physics
Thesis Availability:Public (worldwide access)
Research Advisor(s):
  • Unknown, Unknown
Thesis Committee:
  • Unknown, Unknown
Defense Date:1 January 1953
Record Number:CaltechETD:etd-04232003-102801
Persistent URL:http://resolver.caltech.edu/CaltechETD:etd-04232003-102801
Default Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:1465
Collection:CaltechTHESIS
Deposited By: Imported from ETD-db
Deposited On:23 Apr 2003
Last Modified:26 Dec 2012 02:38

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